System and method for input/output characterization

Details System and method for input/output characterization System and method for input/output characterization

2007-12-21

2009-12-29

Tu, Christine T (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

Reexamination Certificate

active

07640474

ABSTRACT:
A test system in an integrated circuit includes a boundary scan cell. The boundary scan cell includes a first storage element and a second storage element connected in series with the first storage element. The boundary scan cell also includes initialization logic connected between an output of the first storage element and an input of the second storage element. The initialization logic provides the output of the first storage element to the input of the second storage element unchanged during a first operating state, and provides an inverted version of the output of the first storage element to the input of the second storage element during a second operating state. A bi-directional element is connected to receive an output of the second storage element, the bi-directional element feeding the output of the second storage element to an input of the first storage element, such that capture of a state change at the output of the first storage element at the output of the first storage element is facilitated during the second operating state.

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