Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate
2007-07-03
2007-07-03
Tu, Christine T. (Department: 2138)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
Reexamination Certificate
active
10983944
ABSTRACT:
Method and system for initiating a built in self test (“BIST”) operation for memory modules is provided. The method includes, determining if a test access port (“TAP”) controller instruction or an internal register control bit are to be used for initiating the BIST operation; sending the internal register control bit to a memory BIST controller for initiating the BIST operation; and setting a status bit in the internal register after the BIST operation is complete. The system includes a storage controller with an internal register for setting a control bit for initiating a BIST operation; a test access port (“TAP”) controller for sending an instruction to a memory BIST controller to initiate a BIST operation; and a multiplexer for selecting between the control bit and the instruction for initiating the BIST operation.
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Marvell International Ltd.
Tu Christine T.
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