Abrading – Abrading process – Glass or stone abrading
Reexamination Certificate
2005-11-22
2005-11-22
Thomas, David B. (Department: 3723)
Abrading
Abrading process
Glass or stone abrading
C451S285000, C451S289000
Reexamination Certificate
active
06966822
ABSTRACT:
In one aspect, the invention provides a method for planarizing a circular disc-type semiconductor wafer or other substrate. The method includes the steps of pressing a retaining ring surrounding the wafer against a polishing pad at a first pressure; pressing a first peripheral edge portion of the wafer against the polishing pad with a second pressure; and pressing a second portion of the wafer interior to the peripheral edge portion against the polishing pad with a third pressure. The second pressure may be provided through a mechanical member in contact with the peripheral edge portion; and the second pressure may be a pneumatic pressure against a backside surface of the wafer. Desirably, the pneumatic pressure is exerted through a resilient membrane, or is exerted by gas pressing directly against at least a portion of the wafer backside surface. A carrier or subcarrier for a CMP apparatus that includes: a plate having an outer surface; a first pressure chamber for exerting a force to urge the plate in a predetermined direction; a spacer coupled to a peripheral outer edge of the plate; a membrane coupled to the plate via the spacer and separated from the plate by a thickness of the spacer; and a second pressure chamber defined between the membrane and the plate surface for exerting a second force to urge the membrane in a third predetermined direction. Substrate, such as a semiconductor wafer, processed or fabricated according to the invention.
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Hansen David A.
Kajiwara Jiro
Moloney Gerard S.
Reyes Alejandro
Wang Huey-Ming
Dorsey & Whitney LLP
Multi-Planar Technologies, Inc.
Thomas David B.
LandOfFree
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