Switch control apparatus, semiconductor device test...

Details Switch control apparatus, semiconductor device test... Switch control apparatus, semiconductor device test...

2008-07-01

2008-07-01

Britt, Cynthia (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S734000

Reexamination Certificate

active

11089053

ABSTRACT:
A switch control apparatus for controlling a switch is provided, the switch control apparatus including: a sequence memory for recording a sequence pattern, which includes open/close instruction data which instruct the switch thereon to open/close; an address control module for sequentially retrieving each of the open/close instruction data of the sequence pattern from the sequence memory; and an open/close state storage module for storing an open/close state instructed by changed open/close instruction data, when the open/close instruction data retrieved by the address control module is changed, wherein the open/close state stored by the open/close state storage module is provided to the switch such that the switch opens or closes in response to the open/close state.

REFERENCES:
patent: 6711314 (2004-03-01), Mori et al.
patent: 6815992 (2004-11-01), Ng et al.
patent: 2261748 (1993-05-01), None
NN8206146 IBM—TDB VLSI Switching-Circuit Failure Testing. Jun. 1982.

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