Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material
Reexamination Certificate
2007-04-10
2007-04-10
Ghyka, Alexander (Department: 2812)
Semiconductor device manufacturing: process
Coating with electrically or thermally conductive material
To form ohmic contact to semiconductive material
C438S763000, C438S785000, C257SE21171
Reexamination Certificate
active
10910551
ABSTRACT:
Methods are provided for treating germanium surfaces in preparation for subsequent deposition, particularly gate dielectric deposition by atomic layer deposition (ALD). Prior to depositing, the germanium surface is treated with plasma products or thermally reacted with vapor reactants. Examples of surface treatments leave oxygen bridges, nitrogen bridges, —OH, —NH and/or —NH2terminations that more readily adsorb ALD reactants. The surface treatments avoid deep penetration of the reactants into the germanium bulk but improve nucleation.
REFERENCES:
patent: 4828224 (1989-05-01), Crabb
patent: 5221556 (1993-06-01), Hawkins
patent: 6093252 (2000-07-01), Wengert
patent: 6420279 (2002-07-01), Ono et al.
patent: 6613695 (2003-09-01), Pomarede et al.
patent: 6875279 (2005-04-01), Chu et al.
patent: 2003/0445063 (2003-03-01), Hernandez et al.
patent: 2003/0064607 (2003-04-01), Leu et al.
patent: 2003/0082300 (2003-05-01), Todd et al.
patent: 2003/0124818 (2003-07-01), Luo et al.
patent: 2003/0157787 (2003-08-01), Murthy et al.
patent: 2003/0207127 (2003-11-01), Murthy et al.
patent: 2003/0232510 (2003-12-01), Buchanan
patent: 2003/0235931 (2003-12-01), Wada et al.
patent: 2004/0071878 (2004-04-01), Schuhmacher et al.
patent: 2004/0121616 (2004-06-01), Satta et al.
patent: 2004/0175928 (2004-09-01), Abell
patent: 2004/0219735 (2004-11-01), Brabant
patent: 2005/0079692 (2005-04-01), Samoilov et al.
patent: 0858101 (1998-02-01), None
patent: WO 00/15885 (2000-03-01), None
patent: WO 2004/064147 (2004-07-01), None
patent: WO 2004/114393 (2004-12-01), None
Bai et al., “Ge MOS Characteriztics with CVD HfO2 Gate Dielectrics and TaN Gate Electrode”, VLSI Technology Digest of Technical Papers 121-122 (2003).
Cannon, D. et al., “Tensile strained epitaxial Ge films on Si(100) substrates with potential application L-band telecommunications,” Applied Physics Letter, vol. 84, No. 6, Feb. 9, 2004, pp. 906-908.
Colace, L. et al., “Efficient high-speed near-infrared Ge photodetectors integrated on Si substrates,” Applied Physics Letters, vol. 76, No. 10, Mar. 6, 2000, pp. 1231-1233.
Colace, L. et al., “Ge-on-Si Approaches to the Detection of Near-Infrared Light,” IEEE Journal of Quantum Electronics, vol. 35, No. 12, Dec. 1999, pp. 1843-1852.
Fama, S. et al., “High performance germanium-on silicon detectors for optical communications,” Applied Physics Letters, vol. 81, No. 4, Jul. 22, 2002, pp. 586-588.
Hull, R., “Metastable strained layer configurations in the SiGe/Si System,” (1999)EMIS Datareviews, Series No. 24 of SiGe and SiGe:C,edited by Erich Kasper et al., INSPEC (2000), London, UK.
Lee et al., “Growth of strained Si and strained Ge heterostructures on relaxed Si1xGaxGaby ultrahigh vacuum chemical vapor deposition,” J. Vac. Sci. Technol. B 22(1) (Jan./Feb. 2004).
Li, Q, et al., “Selective growth of Ge on Si(100) through vias of SiO2 nanotemplate using solid source molecular beam epitaxy,” Applied Physics Letters, vol. 83, No. 24, Dec. 15, 2003, pp. 5032-5034.
Liu, J. et al., “Silicidation -induced band gap shrinkage In Ge epitaxial films on Si,” Applied Physics Letters, vol. 84, No. 5, Feb. 2, 2004, pp. 660-662.
Masini, G. et al., “High-Performance p-i-n Ge on Si Photodetectors for the Near Infrared: From Model to Demonstration,” IEEE Transactions of Electron Devices, vol. 48, No. 6, Jun. 2001, pp. 1092-1096.
Schollhorn et al., “Coalescene of geranium islands on silicon,” Thin Solid Films, vol. 336 (1988), pp. 109-111.
Hoyas, et al., “Growth and Characterization of Atomic Layer Deposited WC0.7NO.3 on Polymer Films”,Journal of Applied Physics,vol. 95, No. 1; Jan. 1, 2004, pp. 381-388.
ASM America Inc.
Ghyka Alexander
Knobbe Martens Olson & Bear LLP
LandOfFree
Surface preparation prior to deposition on germanium does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Surface preparation prior to deposition on germanium, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Surface preparation prior to deposition on germanium will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3744328