Surface observing apparatus and method

Radiant energy – Inspection of solids or liquids by charged particles

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

250307, 324260, H01J 3700

Patent

active

054364485

ABSTRACT:
A surface observing apparatus for obtaining information of a specimen comprises a probe disposed in the close vicinity of the specimen, a deformable cantilever for holding the probe, a scanning mechanism for scanning a surface of the specimen with the probe and a detector for detecting displacements of the cantilever to thereby allow information of the specimen to be derived on the basis of the displacement of the cantilever. The apparatus further comprises a first detector for detecting a force acting on the probe from the displacement of the cantilever, and a second detector for measuring a change in the force acting on the probe on the basis of the displacement of the cantilever.

REFERENCES:
patent: 4724318 (1988-02-01), Binnig
patent: 4851671 (1989-07-01), Dohl
patent: 4939363 (1990-07-01), Bando et al.
patent: 4985627 (1991-01-01), Gutierrez et al.
patent: 5017010 (1991-05-01), Mamin et al.
patent: 5036196 (1991-07-01), Hosaka et al.
patent: 5144833 (1992-09-01), Amer et al.
patent: 5173605 (1992-12-01), Hayes et al.
patent: 5187367 (1993-02-01), Miyazaki et al.
patent: 5193385 (1993-03-01), Nishioka et al.
Journal of Applied Physics, "Atomic Force Microscope-Force Mapping and Profiling on a Sub 100-A Scale", Y. Martin, May 5, 1987.
Nikkei Microdevices, Nov. 1991.
Journal of Vacuum Science, "Application of Atomic Force Microscopy to Magnetic Materials", P. Grutter, et al., A6(2), Mar./Apr. 1988.
Applied Physics Letters, Y. Martin, et al., "Magnetic Imaging By `Force Microscopy` with 1000 A Resolution", 50(20), May 18, 1987.
Journal of Applied Physics, "Electrical Conduction in Thin Chromium Films", E. S. A. Mehanna, et al., 61(8), Apr. 15, 1987.
Journal of Applied Physics, "Characteristics of BE+ and O+ or H+ Co-Implantation in GsAs/AIGaAs Heterojunction Bipolar Transistor Structures", S. J. Pearton, et al., Jan. 15, 1991.
Journal of Vacuum Science, "The Photon Scanning Tunneling Microscope", T. L. Ferrel, et al., B9(2) Mar./Apr. 1991.
Journal of Research Development, "Scanning Tunneling Microscopy", G. Binnig, et al., vol. 30, No. 4, Jul. 1986.
Journal of Vacuum Science and Technology Part B, "Vacuum Tunneling of Spin Polarized Electrons Detected bby Scanning Tunneling Microscopy", R. Wiesendanger, et al., vol. 9, No. 2, Mar. 1, 1991 New York.
Applied Physics Letters, "Simultaneous Measurement of Lateral and Normal Forces with an Optical-Beam-Deflection Atomic Force Microscope", G. Meyer, et al., vol. 57, No. 20, Nov. 12, 1990 New York.
Journal of Applied Physics, "Magnetic Force Microscopy General Principles and Application to Longitudinal Recording Media", D. Rugar, et al., vol. 68, No. 3, Aug. 1, 1990, New York.
Applied Physics Letter, "Improved Fiber-Optic Interferometer for Atomic Force Microscopy", D. Rugar, et al., vol. 55, No. 25, Dec. 18, 1989, New York.
Journal of Applied Physics, "Atomic Force Microscope-Mapping and Profiling on a Sub 100 Angstrom Scale", Y. Martin, et al., vol. 61, No. 10, May 15, 1987, New York.
Journal of Applied Physics, "Study of Magnetic Stray Field Measurement on Surface Using New Force Microscope", S. Hosaka, et al., vol. 31PT2, No. & A, Jul. 1, 1992, New York.
Journal of Applied Physics, "Simultaneous Observation of 30 Dimensional Magnetic Stray Fiedl and Surface Structure Using New Force Microscope", S. Hosaka, et al., vol. 31PT2, No. 7A, Jul. 1, 1992, New York.
Journal of Vacuum Science and Technology, "Force Microscope with Capacitive Displacement Detection", T. Goddenhenrich, et al., vol. 8, No. 1, Jan. 1, 1990, New York.
IBM Technical Disclosures Bulletin, "Combined Scanning Tunneling and Capacitance Microscope", vol. 32, No. 88, Jan. 1990, New York.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Surface observing apparatus and method does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Surface observing apparatus and method, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Surface observing apparatus and method will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-741210

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.