Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having junction gate
Reexamination Certificate
2005-07-19
2005-07-19
Zarabian, Amir (Department: 2822)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having junction gate
C438S136000, C438S186000, C438S192000
Reexamination Certificate
active
06919241
ABSTRACT:
A process to make a low voltage (under 200 volts) superjunction device employs spaced P type implants into the generally central depth region of an epitaxially formed N layer. The wafer is then placed in a diffusion furnace and the spaced implants are driven upward and downward by 4 to 8 microns to form spaced P pylons in an N type epitaxial body. MOSgated structures are then formed atop each of the P pedestals. The total P charge of each pedestal is at least partially matched to the total N charge of the surrounding epitaxial material. The initial implant may be sandwiched between two discrete epitaxial layers.
REFERENCES:
patent: 6204153 (2001-03-01), Gardner et al.
patent: 6611021 (2003-08-01), Onishi et al.
Kinzer Daniel M.
Qu Zhijun
Wagers Kenneth
International Rectifier Corporation
Ostrolenk Faber Gerb & Soffen, LLP
Perkins Pamela E
Zarabian Amir
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