Substrate processing apparatus and substrate processing...

Adhesive bonding and miscellaneous chemical manufacture – Differential fluid etching apparatus – With workpiece support

Reexamination Certificate

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Details

C118S730000, C134S113000

Reexamination Certificate

active

07811412

ABSTRACT:
A substrate processing apparatus comprises a spin chuck holding and rotating a substrate and an atmosphere blocking member, corresponding in planar shape and size to the substrate, arranged oppositely and proximately to the upper surface of the substrate and formed with a processing solution discharge port and a gas discharge port discharging a processing solution and gas to the central portion of the upper surface of the substrate respectively. The atmosphere blocking member is formed with an outer gas discharge port outside the gas discharge port in plan view for discharging the gas to the upper surface of the substrate. The outer gas discharge port is so formed on the atmosphere blocking member that an arrival position of the gas discharged from the outer gas discharge port is closer to the center of the upper surface of the substrate held by a spin base than an intermediate portion between the center and the outer peripheral edge of the upper surface. Thus provided is an apparatus capable of effectively expelling droplets remaining on the substrate before spin-drying the substrate by high-speed rotation.

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Japanese Office Action dated Jul. 15, 2008 in Japanese counterpart application No. 2003-192898 with translation.
English translation of Abstract for Japanese Patent Application Laid Open No. 11-274135, dated: Oct. 1999.
English translation of Abstract for Japanese Patent Laid Open No. 11-176795, dated Jul. 1999.
Japanese Patent Application Laid Open No. 2002-176026 which is the counterpart, dated Jun. 2001, to U.S. Patent Application Publication No. 2002/0074020 A1.

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