Radiation imagery chemistry: process – composition – or product th – Radiation modifying product or process of making – Radiation mask
Reexamination Certificate
2006-11-28
2006-11-28
Rosasco, S. (Department: 1756)
Radiation imagery chemistry: process, composition, or product th
Radiation modifying product or process of making
Radiation mask
Reexamination Certificate
active
07141338
ABSTRACT:
Corner rounding and image shortening is substantially reduced in an image printed on a substrate by illuminating a photolithographic mask and projecting light transmitted through the photolithographic mask onto the substrate using an optical projection system. The photolithographic mask has a mask pattern that includes at least one printable feature having at least one corner. Incorporated, in the mask pattern, is at least one line feature corresponding to the corner of the printable feature. The line feature is in at least close proximity to the corresponding corner of the printable feature and has a line width that is smaller than a minimum resolution of the optical projection system.
REFERENCES:
patent: 5242770 (1993-09-01), Chen et al.
patent: 5707765 (1998-01-01), Chen
patent: 5725973 (1998-03-01), Han et al.
patent: 5821014 (1998-10-01), Chen et al.
patent: 5827623 (1998-10-01), Ishida et al.
patent: 6238850 (2001-05-01), Bula et al.
patent: 6327023 (2001-12-01), Bukofsky et al.
patent: 6451490 (2002-09-01), Advocate et al.
patent: 6770403 (2004-08-01), Park et al.
Chen Xiaochun Linda
Liegl Bernhard
Varnerin Lawrence
Infineon - Technologies AG
Rosasco S.
Slater & Matsil L.L.P.
LandOfFree
Sub-resolution sized assist features does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Sub-resolution sized assist features, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Sub-resolution sized assist features will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3653307