Structures of high-voltage MOS devices with improved...

Active solid-state devices (e.g. – transistors – solid-state diode – With means to increase breakdown voltage threshold

Reexamination Certificate

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C257S409000, C257SE29023

Reexamination Certificate

active

07888767

ABSTRACT:
A semiconductor structure includes a first high-voltage well (HVW) region of a first conductivity type overlying a substrate, a second HVW region of a second conductivity type opposite the first conductivity type overlying the substrate and laterally adjoining the first HVW region, and a third HVW region of the second conductivity type underlying the second HVW region. A region underlying the first HVW region is substantially free from the third HVW region, wherein the third HVW region has a bottom lower than a bottom of the first HVW region. The semiconductor structure further includes an insulation region in a portion and extending from a top surface of the first HVW region into the first HVW region, a gate dielectric extending from over the first HVW region to over the second HVW region wherein the gate dielectric has a portion over the insulation region, and a gate electrode on the gate dielectric.

REFERENCES:
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patent: 6242787 (2001-06-01), Nakayama et al.
patent: 6265752 (2001-07-01), Liu et al.
patent: 6376891 (2002-04-01), Nagatani et al.
patent: 7375398 (2008-05-01), Wang et al.
patent: 2002/0050619 (2002-05-01), Kawaguchi et al.
patent: 2003/0057459 (2003-03-01), Rumennik
patent: 2004/0150041 (2004-08-01), Watanabe et al.

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