Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2007-08-28
2007-08-28
Crane, Sara (Department: 2811)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
C257S317000, C438S267000
Reexamination Certificate
active
10891076
ABSTRACT:
A flash memory cell is provided. The flash memory cell includes a substrate having a source and a drain formed therein, a bit line contact formed above the drain, a control gate formed above the substrate, a spacer floating gate formed above the substrate and adjacent to the control gate, and a first spacer formed between the bit line contact and the control gate, wherein the first spacer is in contact with both the bit line contact and the control gate.
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Crane Sara
Finnegan Henderson Farabow Garrett & Dunner LLP
Matthews Colleen
ProMOS Technologies Inc.
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