Structure and method of forming vias

Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Of specified material other than unalloyed aluminum

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

257752, 257758, H01L 2348

Patent

active

058474579

ABSTRACT:
A method is provided for forming a contact opening or via of a semiconductor integrated circuit, and an integrated circuit formed according to the same. A first metal region is formed over an underlying region. A first insulating layer is formed over the integrated circuit. A second insulating layer is then formed over the first insulating layer. A portion of the second insulating layer is etched to expose a portion of the first insulating layer wherein the exposed first insulating layer and the remaining second insulating layer form a substantially planar surface. A metal oxide layer is formed over the exposed first insulating layer and the remaining second insulating layer. A photoresist layer is formed and patterned over the metal oxide layer. The metal oxide layer is then selectively etched to form a via exposing a portion of the first insulating layer. The first insulating layer in the via is then selectively etched to expose a portion of the first metal region. The photoresist layer is removed and a second metal layer is then formed over the metal oxide layer and in the via contacting the first metal region.

REFERENCES:
patent: 4523372 (1985-06-01), Balda et al.
patent: 4676867 (1987-06-01), Elkins et al.
patent: 4894351 (1990-01-01), Batty
patent: 4902533 (1990-02-01), White et al.
patent: 5060050 (1991-10-01), Tsuneoka et al.
patent: 5068711 (1991-11-01), Mise
patent: 5110712 (1992-05-01), Kessler et al.
patent: 5252516 (1993-10-01), Nguyen et al.
patent: 5381046 (1995-01-01), Cederbaum et al.
patent: 5633532 (1997-05-01), Sohara et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Structure and method of forming vias does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Structure and method of forming vias, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Structure and method of forming vias will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-180865

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.