Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2005-08-16
2005-08-16
Vu, Hung (Department: 2811)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
C438S223000, C438S227000
Reexamination Certificate
active
06929992
ABSTRACT:
The threshold voltage shift exhibited by strained silicon NMOS devices is compensated with respect to the threshold voltages of PMOS devices formed on the same substrate by increasing the work function of the NMOS gates. The NMOS gate work function exceeds the PMOS gate work function so as to compensate for a difference in the respective NMOS and PMOS threshold voltages. The NMOS gates are preferably fully silicided while the PMOS gates are partially silicided.
REFERENCES:
patent: 5920774 (1999-07-01), Wu
patent: 6130123 (2000-10-01), Liang et al.
patent: 6204103 (2001-03-01), Bai et al.
patent: 6750519 (2004-06-01), Lin et al.
Djomehri Ihsan J.
Goo Jung-Suk
Pan James N.
Xiang Qi
Advanced Micro Devices , Inc.
Foley & Lardner LLP
Vu Hung
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