Semiconductor device manufacturing: process – Formation of semiconductive active region on any substrate – On insulating substrate or layer
Reexamination Certificate
2006-07-24
2009-10-27
Hoang, Quoc D (Department: 2892)
Semiconductor device manufacturing: process
Formation of semiconductive active region on any substrate
On insulating substrate or layer
C438S222000, C257S019000, C257S190000, C257SE21092, C257SE21182, C257SE21207
Reexamination Certificate
active
07608526
ABSTRACT:
A semiconductor workpiece including a substrate, a relaxed buffer layer including a graded portion formed on the substrate, and at least one strained transitional layer within the graded portion of the relaxed buffer layer and method of manufacturing the same. The at least one strained transitional layer reduces an amount of workpiece bow due to differential coefficient of thermal expansion (CTE) contraction of the relaxed buffer layer relative to CTE contraction of the substrate
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Cody Nyles W.
Figuet Christophe
Kennard Mark
ASM America Inc.
Hoang Quoc D
Knobbe Martens Olson & Bear LLP
S.O.I. Tec Silicon On Insulator Technologies, S.A.
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