Sputtering with collinator cleaning within the sputtering chambe

Chemistry: electrical and wave energy – Processes and products – Coating – forming or etching by sputtering

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

20429811, 20429806, C23C 1434

Patent

active

054095875

ABSTRACT:
A method of sputtering material onto semiconductor wafers includes: a) providing a sputtering chamber with a sputtering target, a wafer supporting chuck having a supported first wafer, and a collimator positioned between the target and first wafer for filtering material sputtered from the target onto the first wafer; b) providing ionized sputtering atoms within the chamber; c) bombarding the target with the ionized sputtering atoms to dislodge target atoms; d) passing the dislodged target atoms through collimator openings and onto the first wafer, the dislodged target atoms coating the collimator and openings passing therethrough; e) removing the sputter deposited first wafer from the sputtering chamber without breaking vacuum; f) after removing the sputtered first wafer, cleaning the collimator within the chamber without breaking vacuum between removal of the first wafer and the cleaning of the collimator within the chamber; and g) after cleaning of the collimator within the chamber, providing a second wafer on the wafer supporting chuck within the chamber without breaking vacuum between the cleaning of the collimator and the providing of the second wafer in the chamber; and thereafter sputter depositing target atoms onto the second wafer. The cleaning comprises providing the collimator with a negative potential effective to attract bombarding ionized sputtering atoms to dislodgingly clean target atoms from the collimator. The cleaning is to a degree sufficient to render collimator service lifetime at least equal to that of the sputtering target. Other cleaning techniques are disclosed.

REFERENCES:
patent: 3699034 (1972-10-01), Lins et al.
patent: 4724060 (1988-02-01), Sakata et al.
patent: 5075256 (1991-12-01), Wang et al.
patent: 5139459 (1992-08-01), Takahashi et al.
patent: 5202008 (1993-04-01), Talieh et al.
patent: 5294320 (1994-03-01), Somekh et al.
patent: 5362372 (1994-11-01), Tepman
"IBM Technical Disclosure" vol. 20 No.3 Aug. 1977 pp. 1177-1178.
"Sputtering Cathode Glow Suppression Shield" Lester and McDonough.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Sputtering with collinator cleaning within the sputtering chambe does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Sputtering with collinator cleaning within the sputtering chambe, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Sputtering with collinator cleaning within the sputtering chambe will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1565550

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.