Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate
2007-11-06
2007-11-06
Kerveros, James C. (Department: 2117)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
Reexamination Certificate
active
11054311
ABSTRACT:
A programmable delay circuit that delays the C2clock signal by a variable amount that allows the output from the L1latch to be captured even when there is a large delta between the L1latch and its L2latch. This allows the C2signal to be adjusted within the system dependent upon the amount of cycle steal is needed. The C2clock delay is inhibited during scan operation to prevent glitches and the trailing edge of the delayed C2is controlled to maintain a constant C2duty cycle.
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Chan Yuen H.
Freese Ryan T.
Pelella Antonio R.
Augspurger Lynn L.
Kerveros James C.
Marhoefer Laurence J.
Merant Guerrier
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