Split gate type flash memory device and method for...

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

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C257SE29129, C257SE29300, C257SE21422, C257SE21680

Reexamination Certificate

active

11153392

ABSTRACT:
A split gate type flash memory device and a method of manufacturing the split gate type flash memory device are disclosed. The split gate type flash memory device includes a silicon epitaxial layer formed in an active region of a bulk silicon substrate and a disturbance-preventing insulating film formed in the bulk silicon substrate between a source region and a drain region of the device. According to selected embodiments of the invention, the disturbance-preventing insulating film is formed using a Shallow Trench Isolation (STI) forming process.

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patent: 2006/0019444 (2006-01-01), Lu et al.
patent: 11-214546 (1999-08-01), None
patent: 1998-048947 (1998-09-01), None

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