Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2007-07-03
2007-07-03
Ngô, Ngân V. (Department: 2818)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257SE29129, C257SE29300, C257SE21422, C257SE21680
Reexamination Certificate
active
11153392
ABSTRACT:
A split gate type flash memory device and a method of manufacturing the split gate type flash memory device are disclosed. The split gate type flash memory device includes a silicon epitaxial layer formed in an active region of a bulk silicon substrate and a disturbance-preventing insulating film formed in the bulk silicon substrate between a source region and a drain region of the device. According to selected embodiments of the invention, the disturbance-preventing insulating film is formed using a Shallow Trench Isolation (STI) forming process.
REFERENCES:
patent: 4998220 (1991-03-01), Eitan et al.
patent: 6093951 (2000-07-01), Burr
patent: 6121666 (2000-09-01), Burr
patent: 6124609 (2000-09-01), Hsieh et al.
patent: 6157058 (2000-12-01), Ogura
patent: 6214741 (2001-04-01), Lee
patent: 6323085 (2001-11-01), Sandhu et al.
patent: 7166888 (2007-01-01), Bhattacharyya
patent: 2006/0019444 (2006-01-01), Lu et al.
patent: 11-214546 (1999-08-01), None
patent: 1998-048947 (1998-09-01), None
Ngo Ngan V.
Samsung Electronics Co,. Ltd.
Volentine & Whitt PLLC
LandOfFree
Split gate type flash memory device and method for... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Split gate type flash memory device and method for..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Split gate type flash memory device and method for... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3739996