Split gate flash EEPROM memory cell structure

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

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257314, 257316, 257336, 257344, 257408, H01L 29788

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active

059124873

ABSTRACT:
A MOSFET device on a lightly doped semiconductor substrate comprises forming a dielectric layer on the substrate, a floating gate layer over the dielectric layer, a sacrificial layer on the floating gate layer, and a split-gate channel mask patterned with openings over the sacrificial layer.

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Samachiga et al., "128L Flash EEPROM Using Double-Poly-Silicon Technology," IEEE Solid State Circuit Vol. SC-22, No. 5, Oct. 1987, pp. 676-683.

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