Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2007-04-03
2007-04-03
Owens, Douglas W. (Department: 2811)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S324000, C438S216000, C438S261000
Reexamination Certificate
active
10948966
ABSTRACT:
Silicon-oxide-nitride-oxide-silicon (SONOS) devices and methods of manufacturing the same are provided. According to one aspect, a SONOS device includes a semiconductor substrate having a first surface, a second surface of lower elevation than the first surface, and a third surface perpendicular and between the first and second surfaces; a tunnel dielectric layer on the semiconductor substrate; a charge trapping layer in a form of a spacer on the tunnel dielectric layer on the third surface; a charge isolation layer on the tunnel dielectric layer, which covers the charge trapping layer; a gate that extends over a portion of the first surface, over a portion of the second surface, and is adjacent to a portion of the third surface of the semiconductor substrate on the charge isolation layer; a first impurity region formed below the first surface and near the gate; and a second impurity region formed below the second surface, opposite the first impurity region.
REFERENCES:
patent: 5408115 (1995-04-01), Chang
patent: 5838041 (1998-11-01), Sakagami et al.
patent: 7050330 (2006-05-01), Forbes
Park Young-Sam
Yoon Seung-Beom
F. Chau & Associates LLC
Owens Douglas W.
Samsung Electronics Co,. Ltd.
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