Solar parametric testing module and processes

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters

Reexamination Certificate

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C136S250000

Reexamination Certificate

active

08049521

ABSTRACT:
Embodiments of the present invention generally relate to a module that can test and analyze various regions of a solar cell device in an automated or manual fashion after one or more steps have been completed in the solar cell formation process. The module used to perform the automated testing and analysis processes can also be adapted to test a partially formed solar cell at various stages of the solar cell formation process within an automated solar cell production line. The automated solar cell production line is generally an arrangement of automated processing modules and automation equipment that is used to form solar cell devices.

REFERENCES:
patent: 4144493 (1979-03-01), Lee et al.
patent: 4628144 (1986-12-01), Burger
patent: 4667058 (1987-05-01), Catalano et al.
patent: 4892592 (1990-01-01), Dickson et al.
patent: 5956572 (1999-09-01), Kidoguchi et al.
patent: 6077722 (2000-06-01), Jansen et al.
patent: 6265242 (2001-07-01), Komori et al.
patent: 6281696 (2001-08-01), Voogel
patent: 6468828 (2002-10-01), Glatfelter et al.
patent: 6841728 (2005-01-01), Jones et al.
patent: 7259321 (2007-08-01), Oswald et al.
patent: 7671620 (2010-03-01), Manz
patent: 2002/0153037 (2002-10-01), Fischer
patent: 2005/0252545 (2005-11-01), Nowlan et al.
patent: 2006/0103371 (2006-05-01), Manz
patent: 2009/0188102 (2009-07-01), Lu et al.
patent: 2009/0287446 (2009-11-01), Wang et al.
patent: 2010/0073011 (2010-03-01), Svidenko et al.
patent: 2011/0140726 (2011-06-01), Sullivan et al.
patent: 2004-241449 (2004-08-01), None
patent: WO-03061013 (2003-07-01), None
Brecl et al article, “A Detailed Study of Monolithic Contacts and Electrical Losses in a Large-Area Thin-Film Module,” Mar. 10, 2005, Progress in Photovoltaics: Research and Applications, 2005, vol. 13, pp. 297-310.
Compaan et al article, “Optimization of Laser Scribing for Thin-Film PV Modules,” Jun. 1998, Final Technical Progress Report (Dec. 4, 1995-Nov. 10, 1997).
PCT International Search Report and Written Opinion dated Dec. 2, 2008 for International Application No. PCT/US2008/78165. (APPM/011927 PCT P).
PCT International Search Report and Written Opinion dated Dec. 22, 2008 for International Application No. PCT/US2008/79585. (APPM/011927 PCT 02).
PCT International Search Report and Written Opinion dated Sep. 30, 2009 for International Application No. PCT/US2009/038063. (APPM/013322 PCT P).

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