4. Active solid-state devices (e.g., transistors, solid-state diode
  5. Test or calibration structure

Michel R. Frei

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Article and method for in-process testing of RF products

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Patent

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Solar parametric testing module and processes

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate

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Profile ID: LFUS-PAI-P-697835

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