Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate
2007-06-08
2011-11-22
Gaffin, Jeffrey A (Department: 2117)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
C714S723000, C714S736000
Reexamination Certificate
active
08065574
ABSTRACT:
A programmable logic device, in accordance with one embodiment, includes a plurality of configuration memory cells, wherein at least one configuration memory cell is adapted to function as random access memory. Read/write circuitry writes to and reads from a corresponding first port of the configuration memory cells, including reading from the at least one configuration memory cell adapted to function as random access memory. Soft error detection logic checks for an error in data values stored by the plurality of configuration memory cells, including the at least one configuration memory cell adapted to function as random access memory. The soft error detection logic, for example, may thus be tested by changing a data value stored in the at least one configuration memory cell.
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Cheng Chan-Chi Jason
Wei Qin
Yew Ting
Gaffin Jeffrey A
Haynes and Boone LLP
Lattice Semiconductor Corporation
McMahon Daniel
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