Semiconductor device manufacturing: process – With measuring or testing – Electrical characteristic sensed
Reexamination Certificate
2005-06-14
2005-06-14
Zarabian, Amir (Department: 2822)
Semiconductor device manufacturing: process
With measuring or testing
Electrical characteristic sensed
C438S049000, C324S438000, C324S760020
Reexamination Certificate
active
06905896
ABSTRACT:
A SnO2ISFET device and manufacturing method thereof. The present invention prepares SnO2as the detection membrane of an ISFET by sol-gel technology to obtain a SnO2ISFET. The present invention also measures the current-voltage curve for different pH and temperatures by a current measuring system. The temperature parameter of the SnO2ISFET is calculated according to the relationship between the current-voltage curve and temperature. In addition, the drift rate of the SnO2ISFET for different pH and hysteresis width of the SnO2ISFET for different pH loop are calculated by a constant voltage/current circuit and a voltage-time recorder to measure the gate voltage of the SnO2ISFET.
REFERENCES:
patent: 4397888 (1983-08-01), Yannopoulos et al.
patent: 4641249 (1987-02-01), Gion et al.
patent: 5078855 (1992-01-01), Mochizuki et al.
patent: 5911873 (1999-06-01), McCarron et al.
patent: 6387724 (2002-05-01), Walker
patent: 6531858 (2003-03-01), Chou et al.
Chou Jung-Chuan
Wang Yii Fang
Birch & Stewart Kolasch & Birch, LLP
National Yunlin University of Science and Technology
Perkins Pamela E
Zarabian Amir
LandOfFree
SnO2 ISFET device, manufacturing method, and methods and... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with SnO2 ISFET device, manufacturing method, and methods and..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and SnO2 ISFET device, manufacturing method, and methods and... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3514064