4. Electricity: measuring and testing
  5. Fault detecting in electric circuits and of electric components
  6. Of individual circuit component or element

Yii Fang Wang

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Apparatus for measuring temperature parameters of an ISFET...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Method and apparatus for measuring temperature parameters of...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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SnO 2 ISFET device, manufacturing method, and methods and...

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Responsive to non-optical – non-electrical signal
Reexamination Certificate

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SnO 2 ISFET device, manufacturing method, and methods and...

Electricity: measuring and testing – Determining nonelectric properties by measuring electric...
Reexamination Certificate

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SnO2 ISFET device, manufacturing method, and methods and...

Semiconductor device manufacturing: process – Making device or circuit responsive to nonelectrical signal – Chemically responsive
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2660550

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