Semiconductor device manufacturing: process – Coating of substrate containing semiconductor region or of... – Insulative material deposited upon semiconductive substrate
Reexamination Certificate
2007-11-13
2007-11-13
Hoang, Quoc (Department: 2818)
Semiconductor device manufacturing: process
Coating of substrate containing semiconductor region or of...
Insulative material deposited upon semiconductive substrate
C438S781000, C428S447000, C257S642000, C257SE51046
Reexamination Certificate
active
11431707
ABSTRACT:
A siloxane-based resin having a novel structure and a semiconductor interlayer insulating film using the same. The siloxane-based resins have a low dielectric constant in addition to excellent mechanical properties and are useful materials in an insulating film between interconnect layers of a semiconductor device.
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Lyu Yi Yeol
Ryu Joon Sung
Seon Jong Baek
Song Ki Yong
Harness & Dickey & Pierce P.L.C.
Hoang Quoc
Samsung Electronics Co,. Ltd.
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