Semiconductor device manufacturing: process – Coating of substrate containing semiconductor region or of... – Insulative material deposited upon semiconductive substrate
Reexamination Certificate
2006-01-24
2006-01-24
Wilson, Christian D. (Department: 2891)
Semiconductor device manufacturing: process
Coating of substrate containing semiconductor region or of...
Insulative material deposited upon semiconductive substrate
C438S424000, C438S787000
Reexamination Certificate
active
06989337
ABSTRACT:
A silicon oxide gap-filling process is described, wherein a CVD process having an etching effect is performed to fill up a trench with silicon oxide. The reaction gases used in the CVD process include deposition gases and He/H2mixed gas as a sputtering-etching gas, wherein the percentage of the He/H2mixed gas in the total reaction gases is raised with the increase of the aspect ratio of the trench.
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Chen Neng-Kuo
Chu Hsiu-Chuan
Huang Chih-An
Tsai Teng-Chun
J.C. Patents
United Microelectric Corp.
Wilson Christian D.
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