Silicon and polycide plasma etch appplications by use of silicon

Semiconductor device manufacturing: process – Chemical etching – Combined with coating step

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438696, 438719, 438721, H01L 21311

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active

058638393

ABSTRACT:
During the etching of a silicon-containing material using a halogen-containing etch gas, a silicon-hydride gas is added to the etch gas to provide increased sidewall protection during the etch. Suitably up to about 50 percent by volume of a silicon-containing gas such as silane is added to improve anisotropy of the etch and to prevent notching at the silicon-substrate interface.

REFERENCES:
patent: 4411734 (1983-10-01), Maa
patent: 4778563 (1988-10-01), Stone
patent: 5007982 (1991-04-01), Tsou
patent: 5242536 (1993-09-01), Schoenborn
patent: 5310456 (1994-05-01), Kadomura
patent: 5314576 (1994-05-01), Kadomura
patent: 5354421 (1994-10-01), Tatsumi et al.
patent: 5368686 (1994-11-01), Tatsumi et al.
patent: 5436424 (1995-07-01), Nakayama et al.

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