Semiconductor device manufacturing: process – Chemical etching – Combined with coating step
Patent
1997-06-27
1999-01-26
Niebling, John
Semiconductor device manufacturing: process
Chemical etching
Combined with coating step
438696, 438719, 438721, H01L 21311
Patent
active
058638393
ABSTRACT:
During the etching of a silicon-containing material using a halogen-containing etch gas, a silicon-hydride gas is added to the etch gas to provide increased sidewall protection during the etch. Suitably up to about 50 percent by volume of a silicon-containing gas such as silane is added to improve anisotropy of the etch and to prevent notching at the silicon-substrate interface.
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Olson Dale A.
Qian Xue-Yu
Tsai Patty Hui-ing
Applied Materials Inc.
Morris Birgit E.
Niebling John
Pham Long
Wilson James C.
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