Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2006-03-21
2006-03-21
Assouad, Patrick J. (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C702S097000, C702S170000, C324S229000, C324S228000, C324S230000
Reexamination Certificate
active
07016795
ABSTRACT:
Improved endpoint detection and/or thickness measurements may be obtained by correcting sensor data using calibration parameters and/or drift compensation parameters. Calibration parameters may include an offset and a slope, or other parameters. Drift compensation parameters may include off-wafer measurements.
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Birang Manoocher
Swedek Boguslaw A.
Applied Materials Inc.
Assouad Patrick J.
Fish & Richardson
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