Sidewalls for guiding the via etch

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

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Details

438639, 438640, 438670, 438740, 438638, H01L 214763

Patent

active

060749431

ABSTRACT:
A structure and method to direct the via 270 etch to the top of the interconnect 210, by using a sidewall layer 240, preferably TiN, and thus preventing the etching down the side of the interconnect 210 and exposure of materials residing between the interconnects 210.

REFERENCES:
patent: 5321211 (1994-06-01), Haslam et al.
patent: 5641708 (1997-06-01), Sardella et al.
patent: 5756396 (1998-05-01), Lee et al.
patent: 5827437 (1998-10-01), Yang et al.

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