Semiconductor device manufacturing: process – Formation of semiconductive active region on any substrate – Amorphous semiconductor
Reexamination Certificate
2007-11-20
2007-11-20
Elms, Richard T. (Department: 2824)
Semiconductor device manufacturing: process
Formation of semiconductive active region on any substrate
Amorphous semiconductor
C977S762000, C977S814000, C977S900000, C977S938000
Reexamination Certificate
active
11341519
ABSTRACT:
A silicon nanowire substrate having a structure in which a silicon nanowire film having a fine line-width is formed on a substrate, a method of manufacturing the same, and a method of manufacturing a thin film transistor using the same. The method of manufacturing the silicon nanowire substrate includes preparing a substrate, forming an insulating film on the substrate, forming a silicon film on the insulating film, patterning the insulating film and the silicon film into a strip shape, reducing the line-width of the insulating film by undercut etching at least one lateral side of the insulating film, and forming a self-aligned silicon nanowire film on an upper surface of the insulating film by melting and crystallizing the silicon film.
REFERENCES:
patent: 7109072 (2006-09-01), Saito et al.
patent: 2004/0005747 (2004-01-01), Park et al.
Cho Hans S.
Kim Do-Young
Noguchi Takashi
Xianyu Wenxu
Yin Huaxiang
Elms Richard T.
Harness Dickey & Pierce
Lulis Michael
Samsung Electronics Co,. Ltd.
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