Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate
2006-11-01
2009-10-27
Ellis, Kevin L (Department: 2117)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
C365S201000, C324S765010
Reexamination Certificate
active
07610532
ABSTRACT:
An application specific integrated circuit (ASIC) uses a dedicated interface between core logic and an independent Serializer/De-serializer bus (SBus) to provide SBus capabilities to the core logic. In addition to the dedicated interface, the ASIC includes a controller responsive to a set of signals and a plurality of receivers distributed about the SBus. Each of the receivers is responsive to a set of commands that can be reused to test logic and support functions across each revision of the ASIC as well as to test separate ASICs with similar arrangements of support functions without requiring the generation of a distinct scan vector to test the ASIC. Additional interfaces, such as an I.E.E.E. 1149.1 interface, further extend SBus capabilities to external test equipment.
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Slavick Jeffrey Andrew
Vandivier Suzette Denise
Volz Aaron Matthew
Avago Technologies General IP ( Singapore) Pte. Ltd.
Ellis Kevin L
Merant Guerrier
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