Serial input shift register built-in self test circuit for embed

Details Serial input shift register built-in self test circuit for embed Serial input shift register built-in self test circuit for embed

1996-05-24

1998-10-20

Nguyen, Hoa T.

Excavating

371 223, G01R 3128

Patent

active

058257853

ABSTRACT:
A highly functional built in self test circuit for embedded compiled macros is useful for testing embedded compiled macros having differing parameters. The built in self test circuit receives a scan vector that describes the parameters of the embedded compiled macro that is to be tested. For, example, the number and width of words stored in a read only memory (ROM) are scanned into the built in self test circuit for controlling the test sequences. A state machine within the built in self test circuit cycles through test vector generation, test vector application, data output scanning and compression for signature analysis. Parallel outputs of the embedded compiled devices are serialized so that regardless of the number of outputs, a serial input shift register can be used for signature generation.

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