Sense amplifier with time dependent sensitivity

Static information storage and retrieval – Read/write circuit – Having particular data buffer or latch

Patent

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Details

365200, G11C 1140

Patent

active

045450366

ABSTRACT:
A dynamic RAM integrated circuit has improved resistance to soft errors caused by alpha particles by changing the trip-point voltage of the sense amplifier from a first value that provides resistance to bit line errors to a second, lower value that provides resistance to cell errors.

REFERENCES:
patent: 4439804 (1984-03-01), Riddle et al.

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