Stock material or miscellaneous articles – All metal or with adjacent metals – Composite; i.e. – plural – adjacent – spatially distinct metal...
Reexamination Certificate
2007-08-21
2007-08-21
McNeil, Jennifer (Department: 1775)
Stock material or miscellaneous articles
All metal or with adjacent metals
Composite; i.e., plural, adjacent, spatially distinct metal...
C428S446000
Reexamination Certificate
active
10601475
ABSTRACT:
Semiconductor wafers utilize asymmetric edge profiles (EP) to facilitate higher yield semiconductor device processing. These edge profiles are configured to reduce the volume of thin film residues that may form on a top surface of a semiconductor wafer at locations adjacent a peripheral edge thereof. These edges profiles are also configured to inhibit redeposition of residue particulates on the top surfaces of the wafers during semiconductor processing steps. Such steps may include surface cleaning and rinsing steps that may include passing a cleaning or rinsing solution across a wafer or batch of wafers that are held by a cartridge and submerged in the solution.
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Chon Sang-Mun
Heo Tae-Yeol
Kim Gi-Jung
Kim Woo-Serk
Langman Jonathan
McNeil Jennifer
Myers Bigel & Sibley Sajovec, PA
Samsung Electronics Co,. Ltd.
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