Semiconductor device manufacturing: process – Semiconductor substrate dicing – Having specified scribe region structure
Reexamination Certificate
2008-07-01
2008-07-01
Doan, Theresa T. (Department: 2814)
Semiconductor device manufacturing: process
Semiconductor substrate dicing
Having specified scribe region structure
C438S692000
Reexamination Certificate
active
07393759
ABSTRACT:
In a semiconductor substrate having a notch in an edge portion thereof, each of the two shoulder portions of the notch is configured as an arc and the difference in curvature between the two shoulder portions of the notch is not less than 0 mm and not more than 0.1 mm.
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Japanese Office Action issued in Japanese Patent Application No. JP 2003-427402, dated Apr. 10, 2007.
Hidaka Yoshiharu
Ikenouchi Katsuyuki
Doan Theresa T.
Matsushita Electric - Industrial Co., Ltd.
McDermott Will & Emery LLP
Nguyen Dilinh
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