Semiconductor pixel arrays with reduced sensitivity to defects

Details Semiconductor pixel arrays with reduced sensitivity to defects Semiconductor pixel arrays with reduced sensitivity to defects

2008-06-30

2009-10-27

Ha, Nathan W (Department: 2814)

Semiconductor device manufacturing: process

Making field effect device having pair of active regions...

Having insulated gate

C257SE29315

Reexamination Certificate

active

07608516

ABSTRACT:
A pixel structure is described, comprising at least two selection switches coupled in series to improve the yield of the pixel. Also an array comprising such pixel structures logically organized in rows and columns is described, as well as a method for selecting a row or column of pixel structures in such an array.

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