Semiconductor packages and methods of manufacturing thereof

Semiconductor device manufacturing: process – Packaging or treatment of packaged semiconductor – Metallic housing or support

Reexamination Certificate

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C438S121000

Reexamination Certificate

active

07348218

ABSTRACT:
Described are semiconductor package devices with improved reliability and methods of manufacturing thereof. In one embodiment, a package device is disclosed that includes a chip having an active surface and a coupling surface opposite the active surface, where the chip has one or more integrated circuits and bumps. The device also includes a thermal spreader thermally coupled to the coupling surface of the chip for dissipating heat generated by the chip, and a thermal interface material located between the thermal spreader and the coupling surface of the chip for improving the heat dissipation. In addition, the device also includes a boundary material located between the thermal spreader and the coupling surface of the chip, where the boundary material is configured to surround a perimeter of the thermal interface material to maintain the thermal interface material between the thermal spreader and the coupling surface of the chip.

REFERENCES:
patent: 6118177 (2000-09-01), Lischner et al.
patent: 6285078 (2001-09-01), Nelson
patent: 6756668 (2004-06-01), Baek et al.
patent: 6891259 (2005-05-01), Im et al.

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