Semiconductor package structure and method for manufacturing...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure

Reexamination Certificate

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C257S777000, C257SE21597, C257SE23174, C438S015000, C438S109000

Reexamination Certificate

active

07973310

ABSTRACT:
Semiconductor package structures and methods for manufacturing the same are provided. The semiconductor package structure comprises a substrate unit and a first chip stack structure. The substrate unit comprises a circuit structure having test pads. The first chip stack structure comprises chips, and each of the chips has a plurality of through silicon plugs. The through silicon plugs of two adjacent chips are electrically connected and further electrically connected to the test pads of the substrate unit for electrical testing. Another semiconductor package structure provided by the present invention comprises a first semiconductor chip and a second semiconductor chip. Each of the semiconductor chips has test pads for electrical testing and a plurality of through silicon plugs connecting to the test pads. The second semiconductor chip is mounted on the first semiconductor chip, and a portion of the through silicon plugs of two semiconductor chips are electrically connected with each other.

REFERENCES:
patent: 2007/0222050 (2007-09-01), Lee et al.
patent: 2008/0272372 (2008-11-01), Luo et al.
patent: 2009/0294916 (2009-12-01), Ma et al.
patent: 2011/0045636 (2011-02-01), Chung
patent: 101038908 (2007-09-01), None

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