Semiconductor device manufacturing: process – With measuring or testing – Packaging or treatment of packaged semiconductor
Reexamination Certificate
2011-08-09
2011-08-09
Stark, Jarrett J (Department: 2823)
Semiconductor device manufacturing: process
With measuring or testing
Packaging or treatment of packaged semiconductor
C257S786000, C257S690000, C257S701000, C257S713000
Reexamination Certificate
active
07993941
ABSTRACT:
A semiconductor package is made using a prefabricated post carrier including a base plate and plurality of conductive posts. A film encapsulant is disposed over the base plate of the post carrier and around the conductive posts. A semiconductor die is mounted to a temporary carrier. The post carrier and temporary carrier are pressed together to embed the semiconductor die in the film encapsulant. The semiconductor die is disposed between the conductive posts in the film encapsulant. The temporary carrier and base plate of the post carrier are removed. A first circuit build-up layer is formed over a first side of the film encapsulant. The first circuit build-up layer is electrically connected to the conductive posts. A second circuit build-up layer is formed over a second side of the film encapsulant opposite the first side. The second circuit build-up layer is electrically connected to the conductive posts.
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Chow Seng Guan
Huang Rui
Kuan Heap Hoe
Shim Il Kwon
Atkins Robert D.
Patent Law Group
Stark Jarrett J
STATS ChipPAC Ltd.
Tobergte Nicholas
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