Semiconductor-on-insulator chip incorporating...

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – On insulating substrate or layer

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S164000

Reexamination Certificate

active

10999564

ABSTRACT:
In accordance with a preferred embodiment of the present invention, a silicon-on-insulator (SOI) chip includes a silicon layer of a predetermined thickness overlying an insulator layer. A multiple-gate fully-depleted SOI MOSFET including a strained channel region is formed on a first portion of the silicon layer. A planar SOI MOSFET including a strained channel region formed on another portion of the silicon layer. For example, the planar SOI MOSFET can be a planar fully-depleted SOI (FD-SOI) MOSFET or the planar SOI MOSFET can be a planar partially-depleted SOI (PD-SOI) MOSFET.

REFERENCES:
patent: 4069094 (1978-01-01), Shaw et al.
patent: 4314269 (1982-02-01), Fujiki
patent: 4497683 (1985-02-01), Celler et al.
patent: 4631803 (1986-12-01), Hunter et al.
patent: 4892614 (1990-01-01), Chapman et al.
patent: 4946799 (1990-08-01), Blake et al.
patent: 4952993 (1990-08-01), Okumura
patent: 5130773 (1992-07-01), Tsukada
patent: 5155571 (1992-10-01), Wang et al.
patent: 5273915 (1993-12-01), Hwang et al.
patent: 5338960 (1994-08-01), Beasom
patent: 5378919 (1995-01-01), Ochiai
patent: 5447884 (1995-09-01), Fahey et al.
patent: 5461250 (1995-10-01), Burghartz et al.
patent: 5479033 (1995-12-01), Baca et al.
patent: 5534713 (1996-07-01), Ismail et al.
patent: 5596529 (1997-01-01), Noda et al.
patent: 5629544 (1997-05-01), Voldman et al.
patent: 5656524 (1997-08-01), Eklund et al.
patent: 5708288 (1998-01-01), Quigley et al.
patent: 5714777 (1998-02-01), Ismail et al.
patent: 5763315 (1998-06-01), Benedict et al.
patent: 5789807 (1998-08-01), Correale, Jr.
patent: 5811857 (1998-09-01), Assaderaghi et al.
patent: 5955766 (1999-09-01), Ibi et al.
patent: 5965917 (1999-10-01), Maszara et al.
patent: 5972722 (1999-10-01), Visokay et al.
patent: 6008095 (1999-12-01), Gardner et al.
patent: 6015990 (2000-01-01), Hieda et al.
patent: 6015993 (2000-01-01), Voldman et al.
patent: 6046487 (2000-04-01), Benedict et al.
patent: 6059895 (2000-05-01), Chu et al.
patent: 6100153 (2000-08-01), Nowak et al.
patent: 6103599 (2000-08-01), Henley et al.
patent: 6107125 (2000-08-01), Jaso et al.
patent: 6111267 (2000-08-01), Fischer et al.
patent: 6222234 (2001-04-01), Imai
patent: 6232163 (2001-05-01), Voldman et al.
patent: 6256239 (2001-07-01), Akita et al.
patent: 6258664 (2001-07-01), Reinberg
patent: 6281059 (2001-08-01), Cheng et al.
patent: 6291321 (2001-09-01), Fitzgerald
patent: 6294834 (2001-09-01), Yeh et al.
patent: 6303479 (2001-10-01), Snyder
patent: 6339232 (2002-01-01), Takagi
patent: 6358791 (2002-03-01), Hsu et al.
patent: 6387739 (2002-05-01), Smith, III
patent: 6407406 (2002-06-01), Tezuka
patent: 6413802 (2002-07-01), Hu et al.
patent: 6414355 (2002-07-01), An et al.
patent: 6429061 (2002-08-01), Rim
patent: 6433382 (2002-08-01), Orlowski et al.
patent: 6448114 (2002-09-01), An et al.
patent: 6448613 (2002-09-01), Yu
patent: 6475838 (2002-11-01), Bryant et al.
patent: 6475869 (2002-11-01), Yu
patent: 6489664 (2002-12-01), Re et al.
patent: 6498359 (2002-12-01), Schmidt et al.
patent: 6518610 (2003-02-01), Yang et al.
patent: 6521952 (2003-02-01), Ker et al.
patent: 6524905 (2003-02-01), Yamamichi et al.
patent: 6525403 (2003-02-01), Inaba et al.
patent: 6555839 (2003-04-01), Fitzgerald
patent: 6558998 (2003-05-01), Belleville et al.
patent: 6573172 (2003-06-01), En et al.
patent: 6576526 (2003-06-01), Kai et al.
patent: 6586311 (2003-07-01), Wu
patent: 6600170 (2003-07-01), Xiang
patent: 6617643 (2003-09-01), Goodwin-Johansson
patent: 6621131 (2003-09-01), Murthy et al.
patent: 6633070 (2003-10-01), Miura et al.
patent: 6653700 (2003-11-01), Chau et al.
patent: 6657259 (2003-12-01), Fried et al.
patent: 6657276 (2003-12-01), Karlsson et al.
patent: 6674100 (2004-01-01), Kubo et al.
patent: 6686247 (2004-02-01), Bohr
patent: 6720619 (2004-04-01), Chen et al.
patent: 6724019 (2004-04-01), Oda et al.
patent: 6759717 (2004-07-01), Sagarwala et al.
patent: 6762448 (2004-07-01), Lin et al.
patent: 6784101 (2004-08-01), Yu et al.
patent: 6794764 (2004-09-01), Kamal et al.
patent: 6797556 (2004-09-01), Murthy et al.
patent: 6803641 (2004-10-01), Papa Rao et al.
patent: 6812103 (2004-11-01), Wang et al.
patent: 6872610 (2005-03-01), Mansoori et al.
patent: 6885084 (2005-04-01), Murthy et al.
patent: 6891192 (2005-05-01), Chen et al.
patent: 2002/0031890 (2002-03-01), Watanabe et al.
patent: 2002/0074598 (2002-06-01), Doyle et al.
patent: 2002/0076899 (2002-06-01), Skotnicki et al.
patent: 2002/0125471 (2002-09-01), Fitzgerald et al.
patent: 2002/0153549 (2002-10-01), Laibowitz et al.
patent: 2002/0190284 (2002-12-01), Murthy et al.
patent: 2003/0001219 (2003-01-01), Chau et al.
patent: 2003/0030091 (2003-02-01), Bulsara et al.
patent: 2003/0080386 (2003-05-01), Ker et al.
patent: 2004/0026765 (2004-02-01), Currie et al.
patent: 2004/0087098 (2004-05-01), Ng et al.
patent: 2004/0173815 (2004-09-01), Yeo et al.
patent: 2004/0217448 (2004-11-01), Kumagal et al.
patent: 2004/0262663 (2004-12-01), Bohr et al.
patent: 2004/0266116 (2004-12-01), Mears et al.
patent: 2005/0029601 (2005-02-01), Chen et al.
patent: 2005/0121727 (2005-06-01), Ishitsuke et al.
patent: 2005/0224986 (2005-10-01), Tseng et al.
patent: 2005/0236694 (2005-10-01), Wu et al.
patent: 0683522 (1995-11-01), None
patent: 0828296 (1998-03-01), None
patent: WO 03/017336 (2003-02-01), None
Wang, L.K., et al., “On-Chip Decoupling Capacitor Design to Redce Switching-Noise-Induced Instability in CMOS/SOI VLSI,” Proceedings of the 1995 IEEE International SOI Conference, Oct. 1995. pp. 100-101.
Yeoh, J.C., et al., “MOS Gated Si:SiGe Quantum Wells Formed by Anodic Oxidation,” Semicond. Sci. Technol. (1998), vol. 13, pp. 1442-1445, IOP Publishing Ltd., UK.
Cavassilas, N., et al., “Capacitance-Voltage Characteristics of Metal-Oxide-Strained Semiconductor Si/SiGe Heterostructures,” Nanotech 2002, vol. 1, pp. 600-603.
Blaauw, D., et al.,“Gate Oxide and Subthreshold Leakage Characterization, Analysis and Optimization,” date unknown, 2 pages.
“Future Gate Stack,” International Sematech, 2001 Annual Report, 2 pages.
Chang, L., et al., “Reduction of Direct-Tunneling Gate Leakage Current in Double-Gate and Ultra-Thin Body MOSFETs,” 2001 IEEE, Berkeley, CA.
Chang, L., et al., “Direct-Tunneling Gate Leakage Current in Double-Gate and Ultrathin Body MOSFETs,” 2002 IEEE, vol. 49, No. 12, pp. 2288-2295, Dec. 2002.
Huang, X., et al. “Sub-50 nm P-Channel FinFET,” IEEE Transactions on Electron Devices, vol. 48, No. 5 (May 2001) pp. 880-886.
Shahidi, G.G. “SOI Technology for the GHz era,” IBM Journal of Research and Development, vol. 46, No. 2/3 (Mar./May 2002) pp. 121-131.
Shimizu, A., et al., “Local Mechanical-Stress Control (LMC): A New Technique for CMOS-Performance Enhancement,” International Electron Devices Meeting (2001) pp. 433-436.
Wong, H.-S.P. “Beyond the Conventional Transistor,” IBM Journal of Research and Development (Mar./May 2002) pp. 133-167.
Yang, F.L., et al. “25nm CMOS Omega FETs,” International Electron Devices Meeting, Digest of Technical Papers, (Dec. 2002) pp. 255-258.
Yang, F.L., et al. “35nm CMOS FinFETs,” 2002 Symposium on VLSI Technology Digest of Technical Papers, (Jun. 2002) pp. 104-105.
Ismail, K., et al., “Electron Transport Properties of Si/SiGe Heterostructures: Measurements and Device Implications,” Applied Physics Letters, vol. 63, No. 5 (Aug. 2, 1993), pp. 660-662.
Nayak, D.K., et al. “Enhancement-Mode Quantum-Well GeXSi1-xPMOS,” IEEE Electron Device Letters, vol. 12, No. 4 (Apr. 1991), pp. 154-156.
Gámiz, F., et al., “Strained-Si/SiGe-on-Insulator Inversion Layers: The Role of Strained-Si Layer Thickness on Electron Mobility,” Applied Physics Letters, vol. 80, No. 22, (Jun. 3, 2002), pp. 4160-4162.
Gámiz, F., et al., “Electron Transport in Strained Si Inversion Layers Grown on SiGe-on-Insulator Substrates,” Journal of Applied Physics, vol. 92, No. 1, (Jul. 1, 2002), pp. 288-29

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Semiconductor-on-insulator chip incorporating... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Semiconductor-on-insulator chip incorporating..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor-on-insulator chip incorporating... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3775629

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.