Semiconductor memory testing apparatus

Details Semiconductor memory testing apparatus Semiconductor memory testing apparatus

1996-12-20

1998-05-26

Nguyen, Viet Q.

Static information storage and retrieval

Read/write circuit

Precharge

365204, 365194, 365196, 365205, G11C 2900

Patent

active

057577080

ABSTRACT:
A memory device comprising memory cells associated with word lines for storing data. A timer is connected to determine the length of time during which a selected word line(s) is activated. The word line activation time length is shorter in a testing mode than in a using mode.

REFERENCES:
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patent: 4996671 (1991-02-01), Suzuki et al.
patent: 5233560 (1993-08-01), Foss et al.
patent: 5615157 (1997-03-01), Nakashima et al.
patent: 5623446 (1997-04-01), Hisada
patent: 5654912 (1997-08-01), Hasegawa et al.

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