Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate
2006-10-02
2008-09-16
Le, Vu A (Department: 2824)
Static information storage and retrieval
Read/write circuit
Testing
C365S189050
Reexamination Certificate
active
07426149
ABSTRACT:
A semiconductor memory module and a semiconductor memory device are disclosed. In one embodiment, the invention provides a semiconductor memory module comprising a circuit board, a plurality of semiconductor memory devices adapted to operate during a test mode and a normal operation mode and mounted on the circuit board, a first signal line set comprising a plurality of first signal lines connected to the plurality of semiconductor memory devices, and a plurality of second signal line sets. Each semiconductor memory device comprises first terminals adapted to receive first signals from the first signal lines, second terminals connected to a corresponding one of the second signal line sets, a third terminal adapted to receive an enable signal during the test mode, and a signal transmitting unit adapted to output second signals to the second terminals in response to the enable signal.
REFERENCES:
patent: 7167404 (2007-01-01), Pathak et al.
patent: 7173840 (2007-02-01), Krause et al.
patent: 7272757 (2007-09-01), Stocken
patent: 2001-210095 (2001-08-01), None
patent: 2003-0075160 (2003-09-01), None
Ahn Young-Man
Chung Hoe-Ju
Han You-Keun
Kim Seok-Il
Le Vu A
Samsung Electronics Co,. Ltd.
Volentine & Whitt PLLC
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