4. Static information storage and retrieval
  5. Read/write circuit
  6. Bad bit

I-Fay Wang

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Memory with redundancy

Static information storage and retrieval – Read/write circuit – Bad bit
Patent

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Semiconductor memory having re-configurable fuse set for...

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
Reexamination Certificate

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