Static information storage and retrieval – Read/write circuit – Flip-flop used for sensing
Reexamination Certificate
2008-01-29
2008-01-29
Le, Vu A. (Department: 2824)
Static information storage and retrieval
Read/write circuit
Flip-flop used for sensing
C365S203000
Reexamination Certificate
active
07324395
ABSTRACT:
Semiconductor memory devices and methods of controlling bitlines of such devices in which bitlines of a memory cell array adjacent to an activated memory cell array are precharged to the same voltage. The semiconductor memory devices may include: a sense amplifier which is connected between a pair of bitlines, consisting of a bitline of a first memory cell array and a bitline of a second memory cell array; a first separation unit which controls the connection of the bitline of the first memory cell array to the sense amplifier in response to a first separation control signal; a second separation unit which controls the connection of the bitline of the second memory cell array to the sense amplifier in response to a second separation control signal; a first precharge unit which precharges the bitline of the first memory cell array to a predetermined voltage in response to a first precharge signal; and a second precharge unit which precharges the bitline of the second memory cell array to the predetermined voltage in response to a second precharge signal, wherein the second separation unit disconnects the bitline of the second memory cell array from the sense amplifier after a sensing operation performed on the first memory cell array, which is activated, is terminated, and the second precharge unit precharges the bitline of the second memory cell array.
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Jeong Chang-yeong
Joo Sung-Wan
Park Ji-hoon
Le Vu A.
Myers Bigel & Sibley & Sajovec
Samsung Electronics Co,. Ltd.
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