Static information storage and retrieval – Read/write circuit – Bad bit
Reexamination Certificate
2006-04-11
2006-04-11
Mai, Son (Department: 2827)
Static information storage and retrieval
Read/write circuit
Bad bit
C365S225700
Reexamination Certificate
active
07027338
ABSTRACT:
A semiconductor memory device including a shift redundancy circuit with two buffer chains, two fuses connected to the shift redundancy circuit, a plurality of fuse cut-out detecting circuits for detecting cut-out status of the fuses, and two spare cell control circuits for controlling two spare memory cell rows, wherein word line control signals for controlling corresponding word lines connected to memory cells in a memory cell array are shifted upward and downward to control respective next word lines, thereby replacing two defective memory cell rows with the two spare memory cell rows.
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patent: 5608685 (1997-03-01), Johnson et al.
patent: 5933376 (1999-08-01), Lee
patent: 6021075 (2000-02-01), Ueno
patent: 6765832 (2004-07-01), Ohtani
Lee Chan-Ho
Lim Eun-Kyoung
Lim Jeung-Joo
Harness & Dickey & Pierce P.L.C.
Mai Son
Samsung Electronics Co,. Ltd.
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