Semiconductor memory device including post package repair...

Details Semiconductor memory device including post package repair... Semiconductor memory device including post package repair...

2008-04-04

2010-06-29

Mai, Son L (Department: 2827)

Static information storage and retrieval

Read/write circuit

Testing

C365S189070, C365S200000, C714S718000

Reexamination Certificate

active

07746712

ABSTRACT:
Provided are a semiconductor memory device having a post package repair control circuit and a post package repair method. In the semiconductor memory device and the post package repair method, in a post package repair mode, a second memory bank is used as a fail bit map memory for storing failed bit information regarding a first memory bank, and the first memory bank is used as a fail bit map memory for storing failed bit information regarding the second memory bank.

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