Semiconductor memory device comprising six-transistor memory cel

Static information storage and retrieval – Systems using particular element – Semiconductive

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365154, 357 42, 357 59, 357 71, 3072722, H01L 2710, H01L 2904, H01L 2350, G11C 1140

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047108975

ABSTRACT:
The gate electrode of a first CMOS inverter is connected to the drains of each transistor of a second CMOS inverter via an interconnection, and the gate electrode of the second CMOS inverter is connected to the drains of the first CMOS inverter via an interconnection, to form a flip-flop circuit. A pair of transfer transistors are connected to the nodes of this flip-flop circuit. A plurality of memory cells each constructed by the flip-flop circuit and the pair of transfer transistors are integrated in a matrix form to form a semiconductor memory device. The pair of gate electrodes are formed of a first polycrystalline silicon layer which includes an impurity of the first conductivity type. The pair of interconnections are formed of an impurity-doped second polycrystalline silicon layer and a high-melting point metal layer, and formed on a first interlayer insulation film. The high-melting point metal layer is provided to prevent an increase in the resistance value due to the formation of a pn junction formed by the interconnections.

REFERENCES:
patent: 4233672 (1980-11-01), Suzuki et al.
patent: 4333099 (1982-06-01), Tanguay et al.
patent: 4481524 (1984-11-01), Tsujide
patent: 4613886 (1986-09-01), Chwang
Dingwall et al., "High-Density, Buried-Contact CMOS/SOS Static RAM's", 1978, IEDM, 193-196.
K. Ochii et al., "An Ultralow Power 8K.times.8-Bit Full CMOS RAM with a Six-Transistor Cell," IEEE Journal of Solid-State Circuits, vol. SC-17, No. 5, Oct. 1982.
C. Anagnostopoulos et al., "Latch-Up and Image Crosstalk Suppression by Internal Gettering," IEEE Journal of Solid-State Circuits, vol. SC-19, No. 1, Feb. 1984.
Patent Abstracts of Japan, vol. 5, No. 125, Aug. 12, 1981, p. (E-69) (797), Referencening JP-A-56-61158, (Suwa Seikosha), May 26, 1981.
PCT Publication WO81/02222 of Aug. 6, 1981.

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