Semiconductor memory device capable of preventing oxidation...

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

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Details

C438S253000, C438S396000, C257SE27048, C257SE29342

Reexamination Certificate

active

10828206

ABSTRACT:
A semiconductor device and a fabrication method thereof provides a plug structure composed of a diffusion barrier layer formed at the bottom and on the sides of a contact hole and an oxidation barrier layer formed on the diffusion barrier layer that fills up the inside of the contact hole. This invention prevents contact resistance of a bottom electrode and a plug from increasing as well as implementing high-speed operation and improving the reliability of the semiconductor device.

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