Semiconductor memory device and method for testing same

Details Semiconductor memory device and method for testing same Semiconductor memory device and method for testing same

2006-11-28

2006-11-28

Hoang, Huan (Department: 2827)

Static information storage and retrieval

Read/write circuit

Testing

C365S203000, C365S190000

Reexamination Certificate

active

07142472

ABSTRACT:
A semiconductor memory device having a sense amplifier for detecting data stored in a memory cell via a bit line pair connected to the memory cell, and voltage application means, an output voltage of which being adjustable, for applying the output voltage to the bit line pair so as to disturb potentials on the bit line pair.

REFERENCES:
patent: 6147916 (2000-11-01), Ogura
patent: 6-60699 (1994-03-01), None
patent: 10-199298 (1998-07-01), None
patent: 2001-35197 (2001-02-01), None

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