4. Static information storage and retrieval
  5. Addressing
  6. Plural blocks or banks

Narikazu Usuki

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Semiconductor memory device and method for testing same

Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate

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Semiconductor memory device with less data transfer delay time

Static information storage and retrieval – Addressing – Plural blocks or banks
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2785929

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